CVE-2020-11187 – Possible memory corruption in BSI module due to improper validation of parameter count in …

Vuln ID: CVE-2020-11187

Published:  2021-02-22  07:15:13Z

Description: Possible memory corruption in BSI module due to improper validation of parameter count in Snapdragon Auto, Snapdragon Connectivity, Snapdragon Mobile

Source: NVD.NIST.GOV