CVE-2022-35858 – The TEE_PopulateTransientObject and __utee_from_attr functions in Samsung mTower 0.3.0 all …

Vuln ID: CVE-2022-35858

Published:  2022-08-04  20:15:20Z

Description: The TEE_PopulateTransientObject and __utee_from_attr functions in Samsung mTower 0.3.0 allow a trusted application to trigger a memory overwrite, denial of service, and information disclosure by invoking the function TEE_PopulateTransientObject with a large number in the parameter attrCount.

Source: NVD.NIST.GOV