Vuln ID: CVE-2022-38155
Published: 2022-08-11 01:15:10Z
Description: TEE_Malloc in Samsung mTower through 0.3.0 allows a trusted application to achieve Excessive Memory Allocation via a large len value, as demonstrated by a Numaker-PFM-M2351 TEE kernel crash.
Source: NVD.NIST.GOV